Non-Reciprocal Response in Silicon Photonic Resonators Integrated with 2D CuCrP2S6 at Short-Wave Infrared

Integrating two-dimensional (2D) materials with silicon photonic resonators has emerged as a promising approach to achieving non-reciprocal optical responses, which are critical for advanced photonic devices such as isolators and circulators. While silicon photonics offers compatibility with existing CMOS technology, realizing non-reciprocal functionality typically requires bulky components or high power consumption, posing significant challenges for compact and efficient systems. In this context, 2D materials have garnered attention due to their unique electronic and optical properties, particularly their potential for enabling magnetooptic effects that can induce non-reciprocity in photonic devices.

Among these materials, CuCrP2S6 stands out as a magnetic van der Waals crystal with intrinsic ferromagnetism and strong magneto-optical responses, making it an attractive candidate for integration with silicon photonics. This paper presents the successful integration of CuCrP2S6 with silicon photonic resonators, demonstrating non-reciprocal optical behavior at short-wave infrared wavelengths, which is highly relevant for telecommunications and data communication systems. The results highlight the potential of this hybrid approach to develop compact, energy-efficient photonic devices with enhanced functionality.

Mode analysis was conducted to investigate the interaction between CuCrP₂S₆ and silicon photonic resonators. Finite-difference time-domain (FDTD) simulations were performed to validate experimental results, focusing on transmission spectra across the short-wave infrared range. These simulations provided insights into the device’s behavior under varying conditions, confirming its functionality in non-reciprocal applications. The analysis highlighted how CuCrP₂S₆ interacts with silicon structures, informing the design and optimization of the integrated device.

X-ray photoelectron spectroscopy (XPS) analysis of CuCrP₂S₆ revealed its elemental composition and oxidation states, confirming the presence of copper, chromium, phosphorus, and sulfur. This information was critical for evaluating the material’s compatibility with silicon photonic resonators and its potential for achieving non-reciprocal responses at short-wave infrared wavelengths.

Magnetic force microscopy (MFM) conducted by Dr. Rocky Nguyen provided insights into CuCrP₂S₆’s magnetic properties under varying external fields, essential for understanding its interaction with silicon structures and informing device design optimization.

The integration of CuCrP₂S₆ onto silicon photonic resonators required precise deposition techniques to ensure optimal adhesion and interface quality. Challenges included maintaining material integrity and achieving accurate alignment between CuCrP₂S₆ and the resonator, critical for optimizing performance metrics such as Q-factor and extinction ratio.

Testing focused on measuring transmission spectra across the short-wave infrared range under varying conditions, complemented by finite-difference time-domain (FDTD) simulations to validate experimental results. Additional testing involved characterizing the device under different magnetic fields to observe non-reciprocal effects, confirming its functionality in practical applications.

Structural analysis using Raman spectroscopy and ellipsometry further enhanced understanding of CuCrP₂S₆’s properties and integration success, providing additional insights into material behavior and device performance.

X-ray photoelectron spectroscopy (XPS) analysis confirmed the elemental composition of CuCrP₂S₆, identifying copper, chromium, phosphorus, and sulfur. The oxidation states of these elements were determined, providing insights into their electronic configuration and bonding behavior. This information was critical for evaluating the material’s compatibility with silicon photonic resonators and its potential for achieving non-reciprocal responses at short-wave infrared wavelengths.

Magnetic force microscopy (MFM) conducted by Dr. Rocky Nguyen revealed CuCrP₂S₆’s magnetic properties under varying external fields, essential for understanding its interaction with silicon structures. This analysis informed the design and optimization of the integrated device, highlighting how the material responds to magnetic influences.

Integrating of CuCrP₂S₆ onto silicon photonic resonators required precise deposition techniques to ensure optimal adhesion and interface quality. Challenges included maintaining material integrity and achieving accurate alignment between CuCrP₂S₆ and the resonator, critical for optimizing performance metrics such as Q-factor and extinction ratio.

Testing focused on measuring transmission spectra across the short-wave infrared range under varying conditions, complemented by finite-difference time-domain (FDTD) simulations to validate experimental results. Additional testing involved characterizing the device under different magnetic fields to observe non-reciprocal effects, confirming its functionality in practical applications.

Structural analysis using Raman spectroscopy and ellipsometry provided additional insights into CuCrP₂S₆’s properties and integration success, enhancing understanding of material behavior and device performance.